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High-Resolution X-Ray Scattering - Ullrich Pietsch - Bog

- From Thin Films to Lateral Nanostructures

af Ullrich Pietsch, Vaclav Holy, Tilo Baumbach

indgår i Advanced Texts in Physics serien

High-Resolution X-Ray Scattering af Ullrich Pietsch
Bag om High-Resolution X-Ray Scattering

During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781441923073
  • Indbinding:
  • Paperback
  • Sideantal:
  • 408
  • Udgivet:
  • 12. December 2011
  • Udgave:
  • 220042
  • Størrelse:
  • 235x155x22 mm.
  • Vægt:
  • 652 g.
  • 2-3 uger.
  • 19. Juli 2024

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Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

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Beskrivelse af High-Resolution X-Ray Scattering

During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.

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