Name: High-Resolution X-Ray Scattering
Price: 999.95 DKK
Availability: InStock
Author: Ullrich Pietsch
ISBN: 9781441923073

High-Resolution X-Ray Scattering af Ullrich Pietsch

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During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.

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Sprog:
Engelsk

ISBN:
9781441923073

Forlag:
Springer-Verlag New York Inc.

Indbinding:
Paperback

Sideantal:
408

Udgivet:
12. december 2011

Udgave:
220042

Størrelse:
235x155x22 mm.

Vægt:
652 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 14. januar 2025

Forlænget returret til d. 31. januar 2025

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During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.

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