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(Ipf)Microelectronic Reliability - Edward B Hakim - Bog

Bag om (Ipf)Microelectronic Reliability

Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9780890062845
  • Indbinding:
  • Hardback
  • Sideantal:
  • 396
  • Udgivet:
  • 31. januar 1989
  • Størrelse:
  • 161x30x238 mm.
  • Vægt:
  • 771 g.
  • 2-3 uger.
  • 2. december 2024
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  • BLACK NOVEMBER

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Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af (Ipf)Microelectronic Reliability

Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought

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