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Hardback
8-11 hverdage
1.333,95 kr.

Bag om Kelvin Probe Force Microscopy

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.

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Sprog:
Engelsk

ISBN:
9783642225659

Forlag:
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Indbinding:
Hardback

Sideantal:
334

Udgivet:
21. oktober 2011

Udgave:
2012

Størrelse:
242x162x25 mm.

Vægt:
656 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 10. december 2024

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Beskrivelse af Kelvin Probe Force Microscopy

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.

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