Name: Metrology and Physical Mechanisms in New Generation Ionic Devices
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Author: Umberto Celano
ISBN: 9783319395302

Metrology and Physical Mechanisms in New Generation Ionic Devices af Umberto Celano

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This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM.

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Sprog:
Engelsk

ISBN:
9783319395302

Forlag:
Springer International Publishing AG

Indbinding:
Hardback

Sideantal:
175

Udgivet:
21. juni 2016

Udgave:
12016

Størrelse:
165x245x17 mm.

Vægt:
456 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 16. december 2024

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This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM.

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