Name: Metrology and Physical Mechanisms in New Generation Ionic Devices
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Author: Umberto Celano
ISBN: 9783319819068

Metrology and Physical Mechanisms in New Generation Ionic Devices af Umberto Celano

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This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM.

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Sprog:
Engelsk

ISBN:
9783319819068

Forlag:
Springer International Publishing AG

Indbinding:
Paperback

Sideantal:
175

Udgivet:
7. juni 2018

Udgave:
12016

Størrelse:
155x235x0 mm.

Vægt:
454 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 13. december 2024

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Forlænget returret til d. 31. januar 2025

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This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM.

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