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Bag om Microscopy of Semiconducting Materials

The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy.

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Sprog:
Engelsk

ISBN:
9783642068706

Forlag:
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Indbinding:
Paperback

Sideantal:
540

Udgivet:
19. oktober 2010

Udgave:
12005

Størrelse:
234x156x28 mm.

Vægt:
1442 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 6. marts 2025

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The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy.

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