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Paperback
8-11 hverdage
2.485,95 kr.

Bag om Noncontact Atomic Force Microscopy

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution;

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Sprog:
Engelsk

ISBN:
9783642260704

Forlag:
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Indbinding:
Paperback

Sideantal:
401

Udgivet:
25. februar 2012

Udgave:
2009

Størrelse:
157x234x31 mm.

Vægt:
646 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 12. december 2024

Forlænget returret til d. 31. januar 2025

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Beskrivelse af Noncontact Atomic Force Microscopy

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution;

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