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Hardback
8-11 hverdage
2.188,95 kr.

Bag om Noncontact Atomic Force Microscopy

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS);

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Sprog:
Engelsk

ISBN:
9783540431176

Forlag:
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Indbinding:
Hardback

Sideantal:
440

Udgivet:
24. juli 2002

Udgave:
2002

Størrelse:
241x164x35 mm.

Vægt:
912 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 9. december 2024

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2.138,95 kr.

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Beskrivelse af Noncontact Atomic Force Microscopy

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS);

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