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2.089,95 kr.

Bag om Noncontact Atomic Force Microscopy

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS);

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Sprog:
Engelsk

ISBN:
9783642627729

Forlag:
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Indbinding:
Paperback

Sideantal:
440

Udgivet:
23. oktober 2012

Udgave:
12002

Størrelse:
235x155x24 mm.

Vægt:
692 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 19. november 2024

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Beskrivelse af Noncontact Atomic Force Microscopy

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS);

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