Progress in Nanoscale Characterization and Manipulation

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1.313,95 kr.

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It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy.

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Sprog:
Engelsk

ISBN:
9789811344206

Forlag:
Springer Verlag, Singapore

Indbinding:
Paperback

Sideantal:
508

Udgivet:
11. januar 2019

Udgave:
12018

Størrelse:
155x235x26 mm.

Vægt:
783 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 9. december 2024

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Beskrivelse af Progress in Nanoscale Characterization and Manipulation

It showcases recent advances in scanning electron microscopy, transmission electron microscopy and helium ion microscopy, including advanced spectroscopy, spherical-corrected microscopy, focused-ion imaging and in-situ microscopy.

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