Name: Rapid Reliability Assessment of VLSICs
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Author: A.P. Dorey
ISBN: 9780306434921

Rapid Reliability Assessment of VLSICs af A.P. Dorey

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The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service.

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Sprog:
Engelsk

ISBN:
9780306434921

Forlag:
Springer Science+Business Media

Indbinding:
Hardback

Sideantal:
212

Udgivet:
30. april 1990

Udgave:
1990

Vægt:
570 g.

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The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service.

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