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Secondary Ion Mass Spectrometry SIMS II - Bog

- Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979

indgår i Springer Series in Chemical Physics serien

Secondary Ion Mass Spectrometry SIMS II
Bag om Secondary Ion Mass Spectrometry SIMS II

This volume contains the proceedings of the Tenth International Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a diverse field of research ranging from environmental problems to depth profiling and semiconductors. In doing so, it provides an excellent overview of current research and technology by acknowledged experts in their specialised fields.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783642618734
  • Indbinding:
  • Paperback
  • Sideantal:
  • 300
  • Udgivet:
  • 13. December 2011
  • Udgave:
  • 11979
  • Størrelse:
  • 152x229x17 mm.
  • Vægt:
  • 466 g.
  • 2-3 uger.
  • 17. Juli 2024

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Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af Secondary Ion Mass Spectrometry SIMS II

This volume contains the proceedings of the Tenth International Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a diverse field of research ranging from environmental problems to depth profiling and semiconductors. In doing so, it provides an excellent overview of current research and technology by acknowledged experts in their specialised fields.

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