Name: Speckle Metrology
Price: 4884.95 DKK
Availability: InStock
Author: R.S. Sirohi
ISBN: 9780824789329

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8-11 hverdage
4.884,95 kr.

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Covers speckle metrology and its value as a measuring technique in industry. This book also surveys the origin of speckle displacement and decorrelation, presents procedures for deformation analysis and shape measurement of rough objects, and explains particle image velocimetry (PIV).

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Sprog:
Engelsk

ISBN:
9780824789329

Forlag:
Taylor & Francis Inc

Indbinding:
Hardback

Sideantal:
572

Udgivet:
20. maj 1993

Størrelse:
152x229x31 mm.

Vægt:
861 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 29. november 2024

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Covers speckle metrology and its value as a measuring technique in industry. This book also surveys the origin of speckle displacement and decorrelation, presents procedures for deformation analysis and shape measurement of rough objects, and explains particle image velocimetry (PIV).

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