Name: Transmission Electron Microscopy and Diffractometry of Materials
Price: 1069.95 DKK
Availability: InStock
Author: James Howe
ISBN: 9783642433153

Transmission Electron Microscopy and Diffractometry of Materials af James Howe

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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials.

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Sprog:
Engelsk

ISBN:
9783642433153

Forlag:
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Indbinding:
Paperback

Sideantal:
764

Udgivet:
5. juni 2012

Udgave:
42013

Størrelse:
237x156x44 mm.

Vægt:
1154 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 16. januar 2025

Forlænget returret til d. 31. januar 2025

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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials.

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