Vi bøger
Levering: 1 - 2 hverdage

VLSI Design and Test - Bog

- 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

Bag om VLSI Design and Test

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

Vis mere
  • Sprog:
  • Engelsk
  • ISBN:
  • 9783642420238
  • Indbinding:
  • Paperback
  • Sideantal:
  • 388
  • Udgivet:
  • 16. november 2013
  • Udgave:
  • 2013
  • Størrelse:
  • 235x155x21 mm.
  • Vægt:
  • 6088 g.
  • 8-11 hverdage.
  • 16. december 2024
På lager
Forlænget returret til d. 31. januar 2025

Normalpris

Medlemspris

Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af VLSI Design and Test

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

Brugerbedømmelser af VLSI Design and Test



Find lignende bøger
Bogen VLSI Design and Test findes i følgende kategorier:

Gør som tusindvis af andre bogelskere

Tilmeld dig nyhedsbrevet og få gode tilbud og inspiration til din næste læsning.