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Hardback
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Bag om Applied Scanning Probe Methods II

These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.

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Sprog:
Engelsk

ISBN:
9783540262428

Forlag:
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Indbinding:
Hardback

Sideantal:
420

Udgivet:
1. oktober 2005

Størrelse:
235x155x22 mm.

Vægt:
863 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 9. december 2024

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Beskrivelse af Applied Scanning Probe Methods II

These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.

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