Name: Contactless VLSI Measurement and Testing Techniques
Price: 1259.95 DKK
Availability: InStock
Author: Selahattin Sayil
ISBN: 9783319696720

Contactless VLSI Measurement and Testing Techniques af Selahattin Sayil

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The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.

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Sprog:
Engelsk

ISBN:
9783319696720

Forlag:
Springer International Publishing AG

Indbinding:
Hardback

Sideantal:
93

Udgivet:
4. december 2017

Udgave:
12018

Vægt:
339 g.

Leveringstid: 2-3 uger.
Forventet levering: 17. december 2024

Forlænget returret til d. 31. januar 2025

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The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.

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