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Contactless VLSI Measurement and Testing Techniques - Selahattin Sayil - Bog

af Selahattin Sayil
Contactless VLSI Measurement and Testing Techniques af Selahattin Sayil
Bag om Contactless VLSI Measurement and Testing Techniques

The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783319888194
  • Indbinding:
  • Paperback
  • Sideantal:
  • 93
  • Udgivet:
  • 4. september 2018
  • Udgave:
  • 12018
  • Vægt:
  • 226 g.
  • 1-2 uger.
  • 15. januar 2025
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Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

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Beskrivelse af Contactless VLSI Measurement and Testing Techniques

The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges associated with conventional mechanical wafer testing.

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