Name: Digital Noise Monitoring of Defect Origin
Price: 1331.95 DKK
Availability: InStock
Author: Telman Aliev
ISBN: 9781441944108

Digital Noise Monitoring of Defect Origin af Telman Aliev

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This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise.

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Sprog:
Engelsk

ISBN:
9781441944108

Forlag:
Springer-Verlag New York Inc.

Indbinding:
Paperback

Sideantal:
224

Udgivet:
24. november 2010

Udgave:
12007

Størrelse:
234x156x12 mm.

Vægt:
369 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 10. december 2024

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This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise.

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