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Kelvin Probe Force Microscopy - Bog

- Measuring and Compensating Electrostatic Forces

indgår i Springer Series in Surface Sciences serien

Kelvin Probe Force Microscopy
Bag om Kelvin Probe Force Microscopy

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783642271137
  • Indbinding:
  • Paperback
  • Sideantal:
  • 334
  • Udgivet:
  • 29. November 2013
  • Størrelse:
  • 236x156x23 mm.
  • Vægt:
  • 554 g.
  • 2-3 uger.
  • 23. Juli 2024

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Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af Kelvin Probe Force Microscopy

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.

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