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Microscopy of Semiconducting Materials - Bog

- Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Bag om Microscopy of Semiconducting Materials

The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9783540319146
  • Indbinding:
  • Hardback
  • Sideantal:
  • 540
  • Udgivet:
  • 10. april 2006
  • Udgave:
  • 2005
  • Størrelse:
  • 234x156x30 mm.
  • Vægt:
  • 2100 g.
  • 8-11 hverdage.
  • 9. december 2024
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  • BLACK WEEK

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Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af Microscopy of Semiconducting Materials

The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy.

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