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Plasma Charging Damage - Kin P. Cheung - Bog

Bag om Plasma Charging Damage

In the 50 years since the invention of transistor, silicon integrated circuit (IC) technology has made astonishing advances. In state of the art silicon Ie manufacturing process, plasma is used in more than 20 different critical steps.

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9781852331443
  • Indbinding:
  • Hardback
  • Sideantal:
  • 346
  • Udgivet:
  • 4. oktober 2000
  • Udgave:
  • 2001
  • Størrelse:
  • 234x156x20 mm.
  • Vægt:
  • 1510 g.
  • 8-11 hverdage.
  • 9. december 2024

Normalpris

  • BLACK WEEK

Medlemspris

Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af Plasma Charging Damage

In the 50 years since the invention of transistor, silicon integrated circuit (IC) technology has made astonishing advances. In state of the art silicon Ie manufacturing process, plasma is used in more than 20 different critical steps.

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