Udvidet returret til d. 31. januar 2025

VLSI Design and Test - Bog

- 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers

Bag om VLSI Design and Test

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design;

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  • Sprog:
  • Engelsk
  • ISBN:
  • 9789813297661
  • Indbinding:
  • Paperback
  • Sideantal:
  • 775
  • Udgivet:
  • 18. august 2019
  • Udgave:
  • 12019
  • Størrelse:
  • 155x235x0 mm.
  • Vægt:
  • 1193 g.
  • 8-11 hverdage.
  • 10. december 2024
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Forlænget returret til d. 31. januar 2025

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  • BLACK WEEK

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Beskrivelse af VLSI Design and Test

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design;

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