Udvidet returret til d. 31. januar 2025

Atomic Force Microscopy Based Nanorobotics - Hui Xie - Bog

- Modelling, Simulation, Setup Building and Experiments

Bag om Atomic Force Microscopy Based Nanorobotics

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.

Vis mere
  • Sprog:
  • Engelsk
  • ISBN:
  • 9783642445019
  • Indbinding:
  • Paperback
  • Sideantal:
  • 344
  • Udgivet:
  • 25. november 2014
  • Udgave:
  • 2012
  • Størrelse:
  • 235x155x19 mm.
  • Vægt:
  • 551 g.
  • 8-11 hverdage.
  • 9. december 2024
På lager

Normalpris

  • BLACK WEEK

Medlemspris

Prøv i 30 dage for 45 kr.
Herefter fra 79 kr./md. Ingen binding.

Beskrivelse af Atomic Force Microscopy Based Nanorobotics

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.

Brugerbedømmelser af Atomic Force Microscopy Based Nanorobotics



Find lignende bøger
Bogen Atomic Force Microscopy Based Nanorobotics findes i følgende kategorier:

Gør som tusindvis af andre bogelskere

Tilmeld dig nyhedsbrevet og få gode tilbud og inspiration til din næste læsning.