Surface and Interface Characterization by Electron Optical Methods

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721,95 kr.

Bag om Surface and Interface Characterization by Electron Optical Methods

The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident.

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Sprog:
Engelsk

ISBN:
9781461595397

Forlag:
Springer-Verlag New York Inc.

Indbinding:
Paperback

Sideantal:
319

Udgivet:
1. januar 1989

Udgave:
11988

Størrelse:
244x170x17 mm.

Vægt:
575 g.

Leveringstid: 8-11 hverdage.
Forventet levering: 15. januar 2025

Forlænget returret til d. 31. januar 2025

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The importance of real space imaging and spatially-resolved spectroscopy in many of the most significant problems of surface and interface behaviour is almost self evident.

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